Internal defect detection method for integrated circuit based on Wavelet transform

MA Ge, LIAO Pei-xin, LI Zhi-fu, LIU Gui-yun, CHEN Hai-rong

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Journal of Guangzhou University(Natural Science Edition) ›› 2018, Vol. 17 ›› Issue (6) : 35-40.

Internal defect detection method for integrated circuit based on Wavelet transform

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